EMA 6516 Crystallography and X-ray Diffraction

Session U01, Spring 2010

EC 1116, Monday 3:00-4:50, Wednesday 3:00-3:50 PM

Course Syllabus                                                                                

Goals of the course

This course is to offer advanced knowledge of crystallography and crystal structure characterization techniques. Major topics of the course include: crystallography – symmetry, point group, space group, lattice and crystal systems; Principles of x-ray diffraction – x-ray sources, x-ray detectors, x-ray scattering by matters, Bragg’s law, structure factor;  Experimental techniques for x-ray diffraction – sample preparation, data acquisition, unit cell determination and refinement, structure determination and refinement. The course work also includes projects for data process. Students after this course are expected to be able to work independently on characterize structures of materials using x-ray diffraction.

Prerequisite: Fundamentals of crystallography

1.    Instructor

Jiuhua Chen

Mechanical and Materials Engineering Department

EC Office: Rm 3471

Ph: (305) 348-3140

Office hours: Monday and Wednesday 10:00-12:00 PM or by appointment

University Park Office: VH 140

Ph: (305) 348-3577

Office hours: by appointment

Email: chenj@fiu.edu


2.    Textbooks

Textbook: Fundamentals of Powder Diffraction and Structural Characterization of Materials, by Vitalij K. Pecharsky and Peter Y. Zavalij, Springer 2003. ISBN-10: 0-387-24147-7.

3.    Expectation for student performance in the class and attendance

Students are expected to come to every class session, and complete all reading and homework assignments on time for the purpose of understanding the course content. Although no grade will be assigned to attendance, missing lectures will be surely reflected on your performance in homework assignments and examinations. Quizzes are given in the class, and may or may not be announced in advance. Students are expected to conduct individual course project during and after class session. Grading is based on quizzes/homework, one exam and course projects (performance and presentation).

4.    Grading scheme:         


Quizzes/Homework                            30%

Exam                                                  30%

Project                                                 40%

            TOTAL                                              100%

5.    Grading policy:


Points%           Letter Grade


95 and above               A

90-95                           A-       

87-90                           B+

84-87                           B

80-84                           B-

77-80                           C+

74-77                           C

70-74                           C-

67-70                           D+

64-67                           D

60-64                           D-

Below 60                     F


6.    Tentative Class Schedule (subject to change according to course progress)


Week              Topic 

One                 Course Overview, crystal state, symmetry elements, point group

Two                 Lattice and space group, x-ray generation and detectors

Three               X-ray interactions with matters and x-ray diffraction

Four                 Intensity of powder diffraction, systematic absences

Five                 X-ray diffraction techniques, sample preparation

Six                   Safety, data processing

Seven              Unit cell determination and refinement, indexing program

Eight               Midterm, start of project

Nine                Crystal structure solution, program for powder data

Ten                  Crystallography programs

Spring break

Eleven             Crystal structure refinements

Twelve                        Rietveld program

Thirteen           Project

Fourteen          Project presentations



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