EMA 6516 Crystallography and X-ray Diffraction
Session U01, Spring 2010
EC 1116, Monday 3:00-4:50, Wednesday 3:00-3:50 PM
Goals of the course
This course is to offer advanced knowledge of crystallography and crystal structure characterization techniques. Major topics of the course include: crystallography – symmetry, point group, space group, lattice and crystal systems; Principles of x-ray diffraction – x-ray sources, x-ray detectors, x-ray scattering by matters, Bragg’s law, structure factor; Experimental techniques for x-ray diffraction – sample preparation, data acquisition, unit cell determination and refinement, structure determination and refinement. The course work also includes projects for data process. Students after this course are expected to be able to work independently on characterize structures of materials using x-ray diffraction.
Prerequisite: Fundamentals of crystallography
Mechanical and Materials Engineering Department
EC Office: Rm 3471
Ph: (305) 348-3140
Office hours: Monday and Wednesday 10:00-12:00 PM or by appointment
University Park Office: VH 140
Ph: (305) 348-3577
Office hours: by appointment
Textbook: Fundamentals of Powder Diffraction and Structural Characterization of Materials, by Vitalij K. Pecharsky and Peter Y. Zavalij, Springer 2003. ISBN-10: 0-387-24147-7.
Students are expected to come to every class session, and complete all reading and homework assignments on time for the purpose of understanding the course content. Although no grade will be assigned to attendance, missing lectures will be surely reflected on your performance in homework assignments and examinations. Quizzes are given in the class, and may or may not be announced in advance. Students are expected to conduct individual course project during and after class session. Grading is based on quizzes/homework, one exam and course projects (performance and presentation).
Points% Letter Grade
95 and above A
Below 60 F
One Course Overview, crystal state, symmetry elements, point group
Two Lattice and space group, x-ray generation and detectors
Three X-ray interactions with matters and x-ray diffraction
Four Intensity of powder diffraction, systematic absences
Five X-ray diffraction techniques, sample preparation
Six Safety, data processing
Seven Unit cell determination and refinement, indexing program
Eight Midterm, start of project
Nine Crystal structure solution, program for powder data
Ten Crystallography programs
Eleven Crystal structure refinements
Twelve Rietveld program
Fourteen Project presentations
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